Multiple-film back-reflection camera for atomic strain studies

Anthony B. Marmo
naca-tn-2224
Nov 1950


A new back-reflection X-ray diffraction technique, which eliminates some of the principal limitations and reduces the remaining limitations imposed by conventional single-film back-reflection methods, was developed through the use of a multiple-film camera containing four parallel films separated by known distances.

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http://naca.central.cranfield.ac.uk/reports/1950/naca-tn-2224.pdf